Showing results: 901 - 915 of 4352 items found.
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TestStation Duo -
Teradyne, Inc.
The TestStation Duo is a true concurrent test system with independent test modules providing fast in-circuit test throughput and lowering high-volume production costs.It effectively doubles the test throughput of conventional in-circuit test systems, without doubling capital equipment costs or increasing manufacturing floor space, by combining two complete and independent test modules inside a single tester frame.
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Amida Technology, Inc.
AMIDA has introduced two new analog/mixed-signal and logic options in the AMIDA-3000 series in recent years—the AMIDA-3001XP and AMIDA-3KS test systems. Both reinforce the AMIDA-3000 series' ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. The AMIDA-3000 series provides more than twice the number of analog channels of its modules per test system, thus greatly reducing the acquisition cost of each channel and more than doubling the number of analog channels in the entire test system. This results in a higher number of parallel tests and a higher level of capability for this system, as well as a lower and more cost-effective IC unit test cost for this tester. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The built-in instant messaging protocol detection function of AMIDA-3001XP test machine not only simplifies the complexity and difficulty of test development, but also greatly shortens the test time by using its high-speed computing capability.
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ETH -
ENGMATEC GmbH
The ENGMATEC test handler as the "heart" of our inline test solutions impresses with its wide range of applications for in-circuit, functional or final tests. All components of the modular system are coordinated with one another and can be combined with one another and with various production systems. Vision systems, scanners, marking devices and many other functions can be integrated.
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CS-4001/127 -
G. Jost -Electronic
Our CS-4001/127 is the perfect mobile test system for periodic battery testing. In combination with an electronic load, the condition of a battery system (SOH) can be determined exactly during a capacity test.
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RF Test Equipment -
Seibersdorf Labor GmbH
We calibrate following types of RF test equipment:EMF test systems (frequency selective)EMF test systems (broadband)Field strength transfer standards (e.g. RefRad)Line Impedance Stabilisation Network (LISN)Cable, attenuator, couplerAntennaField Probe
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UltraFLEX-M -
Teradyne, Inc.
The UltraFLEX-M builds on the advanced test technology and architecture of the proven UltraFLEX test system to ensure high test quality at the lowest cost of test for high-speed memory devices.
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Elektra -
Rohde & Schwarz GmbH & Co. KG
The R&S®ELEKTRA test software controls complete EMC systems and automates measurements of equipment under test (EUT) being certified for emissions (EMI) and immunity (EMS). R&S®ELEKTRA simplifies configuration of test systems and test descriptions in accordance with common standards. It speeds up test execution and paves the way to quickly generating a comprehensive test report.
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SysColl -
PSE Instruments GmbH
For certification in many markets, performance of the complete factory made system (for example thermosiphon systems) plays an equally important role as collector performance. Our SysColl test stand is a combined test facility for performance testing of both solar collectors and solar thermal systems. This allows you to take advantage of a flexible two in one test solution.
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Bloomy Controls, Inc.
The Bloomy Simulation Reference System provides a hardware in-the-loop (HIL) test environment for dynamic, closed-loop testing of many aerospace and transportation control systems. The reference system integrates the computing, I/O, and software components needed for standalone use or to form the basis of a more complex test system.
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Kokusai Co., Ltd.
This test machine is a tire wear test device that employs an electric servomotor power circulation system.
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Terotest Systems Ltd.
Backplane and cable test systems from Terotest include LINX, a fixtureless test system. Each LINX test card plugs directly into the unit under test, which removes the necessity for long test cables and fixtures. This is called distributed testing and results in dramatically lowered costs. LINX is extremely easy to use, with a self-learn function or input from CAD.
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DTM -
Triangle MicroWorks Inc.
The Distributed Test Manager (DTM) is a Windows™ application which enables many different types of system level testing by simulating multiple devices in a system. DTM is a system level simulator that is unique compared to other Triangle MicroWorks tools which test the communications of a single device. DTM is a highly extensible tool with multiple options for configuring devices, creating test cases, and simulating data in the system.
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Imapact 7BT -
Lorlin Test Systems
The 7BT Benchtop Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The 7BT automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results and uses a Windows 10 64-BIT Operating Systems and a USB 2.0 Interface.
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Verified Systems International GMBH
The test system cluster architecture is based on dual CPU or 4-CPU PCs acting as cluster nodes. The nodes communicate and synchronise over a high-speed network (Myrinet or InfiniBand). A modification of the Linux operating system allows to run the test execution and evaluation algorithms in hard real-time on reserved CPUs, where scheduling is non-preemptive and controlled by the test system itself. The interrupts caused by interfaces to the system under test may be relayed to CPUs designated explicitly for their handling. This approach offers the opportunity to utilise high-performance standard hardware and the services provided by the widely accepted Linux operating system in combination with all mechanisms required for hard real-time computing. The cluster architecture presents an opportunity to distribute interfaces with high data throughput on different nodes, so that PCI bus overload can be avoided. In addition, the CPU load can be balanced by allocating test data generators, environment simulations and checkers for the behaviour of the system under test ("test oracles") on dedicated CPUs.